Design of Generic Embedded Memory Built in Self Test Circuit
With the increment of area of memory in SoC,embedded memory test is becoming increasingly significant. The March algorithm and its derived algorithms,which are the mainstream algorithm in memory test domain,can achieve very good effects in terms of testing time and fault coverage. However,because of the different accesses of different types of memories,the same algorithm cannot apply to testing different types of memories. In SoC,implanting different circuits for testing different types of memories will result in high hardware overhead. To solve this problem,we design a generic embedded memory built-in self-test circuit which,according to different types of memories,chooses the suitable testing algorithms through configuring a set of March algorithm registers. This method will make the testing circuit adapt to different types of memories and the corresponding hardware overhead is relatively low. Verified by Modelsim simulation,this method has a flexible configuration and has a high coverage of common faults.
embedded memory built in self test March algorithm.
Qiao Liyan Bai Shi Zhao Xin Wang Ge
Department of Automatic Test and Control,Harbin Institute of Technology,Harbin,Heilongjiang,150001,C The Military Deputy Office Being Stationed In 699 Factory,The Second Artillery Troops,Beijing,100089
国际会议
2009 9th International Conference on Electronic Measurement & Instruments(第九届电子测量与仪器国际会议 ICEMI2009)
北京
英文
1321-1324
2009-08-16（万方平台首次上网日期，不代表论文的发表时间）