Research on Image Acquisition System Applied to Profile Measurement

摘要：

Profile measurement plays an important role in machine vision. Profile imaging quality,affected by illumination,scattering characteristics,and other factors,directly determines the accuracy and repeatability of profile measurement. An image acquisition system featured with parallel projection achieved by the use oftelecentric optics and parallel illumination is proposed in the study .Influencing factors of profile image acquisition are analyzed in detail. Mathematical formulas are presented for calculation of related parameters. Experimental results show that the proposed image acquisition system can efficiently improve the profile imaging quality and is beneficial to profile measurement.

关键词： profile measurement image acquisition system machine vision.

作者: ZhuJia LiXing-fei

作者单位: State Key Laboratory of Precise Measurement Technology & Instrument Tianjin University Tianjin 300072,China

会议类型: 国际会议

会议名称: 2009 9th International Conference on Electronic Measurement & Instruments(第九届电子测量与仪器国际会议 ICEMI2009)

会议地点: 北京

会议语种:英文

页码: 1956-1961

在线出版日期: 2009-08-16（万方平台首次上网日期，不代表论文的发表时间）