Development of Sample Wheel Control System Based on AFM Used in Deep Space Ezploration

摘要：

Research and development of sample wheel control system are one of the key technologies in atomic force microscopy (AFM) of deep space exploration. small size,light weight and low power consumption are realized in modular design at the electric control system of Sample wheel. Using the AVRATmega 16processor,the module communicates with the industrial motherboard of AFM scanner through the RS232 self-defined communication protocol. Open circuit and software design framework make a convenient interface for upgrading. The results from test institution show that the control system is full-featured,stable. It implements well in every control measure.

关键词： AFM Sample wheel AVR Single Chip Control system

作者: Yingzi Li Jianqiang Qian Wenliang Liu Yuan Li Baocheng Hua Yong Yang

作者单位: School of Physics and Nuclear Energy Engineering,Beihang University,Beijing 100191,China

会议类型: 国际会议

会议名称: 2009 9th International Conference on Electronic Measurement & Instruments(第九届电子测量与仪器国际会议 ICEMI2009)

会议地点: 北京

会议语种:英文

页码: 2938-2942

在线出版日期: 2009-08-16（万方平台首次上网日期，不代表论文的发表时间）