The Study on Data Processing Based on CCD Scanning and Detecting Device on Wavelet Transform

摘要：

In order to increase accuracy of the linear array CCD edge detection system, a wavelet-based sub-pixel edge detection method is proposed, the basic process is likethis: firstly, according to the step gradient features, automatically calculate the pixel-level border of the CCD image. Then use the wavelet transform algorithm to devide the images edge location in sub-pixel level, thus detecting the subpixel edge. In this dissertation, real-time defects data processing technology based on Field Programmable Gate Array(FPGA) was developed for this purpose. This instrument was used for polymeric film inspection for the first time. The experimental results demonstrated that defects within 70 μm～ 1000μm were inspected effectively by the CCD scanning defects inspection instrument, that this method has a repetition error no more than 2.24 pixels, with high precision and good anti-noise ability.

关键词： Wavelet transform data processing defects inspection field programmable gate array Edge detection charge coupled device.

作者: Yumei Wang Guosheng Xu

作者单位: Information and Control Engineering College,Weifang University 261061 Weifang,China

会议类型: 国际会议

会议名称: 2009 9th International Conference on Electronic Measurement & Instruments(第九届电子测量与仪器国际会议 ICEMI2009)

会议地点: 北京

会议语种:英文

页码: 3728-3731

在线出版日期: 2009-08-16（万方平台首次上网日期，不代表论文的发表时间）