Test generation for combinational circuits Based on DNA computing

摘要：

The aim of this paper is to illustrate the automatic test generation for combinational circuits based on DNA computing. In the algorithm the Chromosomes are encoded by the four bases of nucleic acid Σ= A,G,C,T and the gene-class genetic manipulation is introduced to ensure the population diversity; In addition, the test set size produced by DNA chain is controlled at different stages of test generation so as to reduce the redundancy of test sets and accelerate the speed of test generation. The experimental results for benchmark circuit iscas85 show that this algorithm can achieve high fault coverage and substantially reduce the size of test vector sets.

关键词： DNA computing Fault simulation DNA-GA Test generation

作者: Wang Jiejun Xu Chuan-pei

作者单位: School of Electronic Engineering,Guilin University of Electronic Technology,Guilin,541004,China

会议类型: 国际会议

会议名称: 2009 9th International Conference on Electronic Measurement & Instruments(第九届电子测量与仪器国际会议 ICEMI2009)

会议地点: 北京

会议语种:英文

页码: 3878-3881

在线出版日期: 2009-08-16（万方平台首次上网日期，不代表论文的发表时间）