CORRELATING MATERIALS STRUCTURE WITH CARRIER MOBILITY IN HIGH PERFORMANCE SEMICONDUCTING POLYMERS

摘要：

The microstructure of organic semiconductor films can impact charge carrier mobility because it defines the persistence and quality of n overlap in the source-drain plane. Important aspects of microstructure include the intermolecular packing arrangement within crystals, the surface-relative crystal orientation, and the overall crystal size and connectivity. We combine complementary microstructure measurements including polarized absorption spectroscopies (IR, vis, and X ray), scanning probe techniques, and X-ray diffraction to investigate the microstructure details of polymer semiconductors for organic thin film transistors (OTFTs). The investigations establish correlations between primary chemical structure, processing, film microstructure, and carrier mobility. These fundamental relationships yield practical guidelines for synthesis and processing.

作者: Eric K.Lin Dean M.DeLongchamp R.Joseph Kline Daniel A.Fischer Lee J.Richter Andrew J.Moad Leah A.Lucas Martin Heeney Iain McCulloch

作者单位: Polymers Division,Materials Science and Engineering Laboratory,National Institute of Standards and T Ceramics Division,Materials Science and Engineering Laboratory,National Institute of Standards and T Surface and Microanalysis Division,Chemistry Laboratory,National Institute of Standards and Technolo Polymers Division,Materials Science and Engineering Laboratory,National Institute of Standards and T Merck Chemicals,Chilworth Science Park,Southampton S016 7QD (UK)

会议类型: 国际会议

会议名称: International Symposium on Polymer Physics(2008年国际高分子物理学术会议PP2008)

会议地点: 厦门

会议语种:英文

页码: 26

在线出版日期: 2008-06-08（万方平台首次上网日期，不代表论文的发表时间）