The Study on Real-time Data Processing Based on CCD Scanning and Detecting Device on FPGA
To solve the crossing-linkable polyethylene (XLPE) insulation compound purity evaluation problem, a high speed scanning measurement system was designed according to FPGA. With the updated information technology and advanced electronic devices, it is possible to develop a new inspecting technology for sorting, checking and evaluating material quality, by which defects microscopic images can be real-time recorded, processed and displayed. The experimental results demonstrated that defects within 70μm~1000μm were inspected effectively by the CCD scanning defects inspection instrument, and Good agreement was shown between defects images real-time reconstructed and optical microscopic images not only in shape but also in gray.
data processing defects inspection field programmable gate array charge coupled device.
XU Guo-sheng
Information and Control Engineering College,Weifang University 261061 Weifang,China
国际会议
上海
英文
1896-1899
2009-11-20（万方平台首次上网日期，不代表论文的发表时间）