De-embedding of Board Parasitics with T-parameters for S-parameter Measurements of Integrated Circuits on PCB-Ezaminations in One-port Measurements-

摘要：

1.Introduction Better signal integrity(SI), power integrity(PI) as well as EMC performance have become more important as devices are more high-speed, of higher integration and lower source voltage. In order to predict and estimate these 3 performances in the design phase, the model simplified to some extent is suitable. The authors have been proposed the linear equivalent circuit and current sources (LECCS) model which quickly predicts EMC performance1.

作者: Kazuki MAEDA Kengo IOKIBE Yoshitaka TOYOTA Ryuji KOGA

作者单位: Graduate School of Natural Science and Technology,Okayama Univ.3-1-1 Tsushimanaka,,Kita-ku,Okayama-shi,700-8530 Japan

会议类型: 国际会议

会议名称: Asia-Pacific Conference on Environmental Electromagnetics CEEM2009(第五届亚太环境电磁学学术会议)

会议地点: 西安

会议语种:英文

页码: 246-249

在线出版日期: 2009-09-16（万方平台首次上网日期，不代表论文的发表时间）