Investigation on Radiated EMI Noise Identification for High Speed Digital PCB

摘要：

In the paper, a new approach by using near-field probes is proposed to identify mechanism of radiated EMI noises,I.e.CM noise and DM noise, according to but only the internal relationship between radiated EM field and near-field wave impedance,but also the inner relationship between wave impedance and measurement distance.Then, radiated EMI noises decrease obviously after suppressed by using 3-m chamber measurement.The research shows that the proposed method is effective and valid.

关键词： Radiated EMI Noise Diagnosis High speed digital PCB

作者: Zhao Yang Yan Wei Feng Zhiming Luo Yongchao LiShijin Yue Dong

作者单位: School of Electrical & Automation Engineering,Nanjing Normal University,Nanjing 210042;State Key Lab School of Electrical & Automation Engineering,Nanjing Normal University,Nanjing 210042 Jiangsu Metrology Institute of Science & Technology,Nanjing 210035

会议类型: 国际会议

会议名称: Asia-Pacific Conference on Environmental Electromagnetics CEEM2009(第五届亚太环境电磁学学术会议)

会议地点: 西安

会议语种:英文

页码: 297-300

在线出版日期: 2009-09-16（万方平台首次上网日期，不代表论文的发表时间）