Thin-Slot Formalism for the FDTD Analysis Of Thin-Slot Penetration Considering Ground Reflection

摘要：

In this paper, a new rectangular enclosure model for shielding effectiveness (SE) is established,which is in more accordant with practical engineering environment for it considered the ground reflection.The SE is analyzed by using different thin-slot formalism methods and the results given by C-TSF, ETSF and CP are compared with results of the finer resolution.When the width of the slot is comparable with the space increment,both ETSF and CP formalism are feasible,However,ETSF accords with finer resolution results more exactly. When the slot is far narrower than space increment,C-TSF is in good agreement with finer resolution.From the conclusion we can get a fast and accurate way of determining the SE through aperture of various sizes.

关键词： FDTD shielding enclosure thin-slot C-TSF CP ETSF

作者: Xiong Run Chen Bin Yin Qin Yang Xiaoshuan Zhou Bihua

作者单位: Lab of Electromagnetics,Nanjing Engineering Institute No.1,Haifuxiang Street,Nanjing 210007,China

会议类型: 国际会议

会议名称: Asia-Pacific Conference on Environmental Electromagnetics CEEM2009(第五届亚太环境电磁学学术会议)

会议地点: 西安

会议语种:英文

页码: 341-344

在线出版日期: 2009-09-16（万方平台首次上网日期，不代表论文的发表时间）