The Bayesian Reliability Growth Model of Ezponential Product Based on Dynamic Distribution Parameters
Regarding to the problems of traditional reliability growth models fur example,Duane model,which have been used in the multiple stages reliability assessment This paper firstly studied on the statistical analysis method of different stages and different level data based on sequence binding model, then modeled the change event of dynamic distribution parameters during test and gave the Bayesian reliability growth model of multiple stages exponential distribution product Finally the method has been validated by a practice example.
Non-Homogeneous Populations statistic Sequence relationship Bayes Reliability growth model Ezponential distribution
Junyong Tao Zhimao Ming Xun Chen
Reliability Engineering Laboratory,National University of Defense Technology Changsha,Hunan CHINA 410073
国际会议
2009 8th International Conference on Reliability,Maintainability and Safety(第八届中国国际可靠性、维修性、安全性会议)
成都
英文
330-332
2009-08-24(万方平台首次上网日期,不代表论文的发表时间)