Reliability Demonstration Test Model for Binomial System with Reliability Growth

摘要：

Many complex engineering systems have reliability growth in successive test stages.In most existing reliability demonstration test models,reliability growth is not incorporated as modeling assumption.In this paper,for binomial system with 2 test stages, a reliability demonstration test model is presented that naturally takes possible reliability growth into consideration. Likelihood ratios are defined for various possible situations, and statistical decision rules are derived.With a given example, the relative lower decision risk of the proposed model is illustrated by comparison with that of classical demonstration test model.

关键词： binomial system demonstration test discrete reliability growth model

作者: Xiaoyue Wu

作者单位: College of Information Systems & Management National University of Defense Technology Changsha,China

会议类型: 国际会议

会议名称: 2009 8th International Conference on Reliability,Maintainability and Safety(第八届中国国际可靠性、维修性、安全性会议)

会议地点: 成都

会议语种:英文

页码: 367-369

在线出版日期: 2009-08-24（万方平台首次上网日期，不代表论文的发表时间）