Success Ratio Sequential Test Plan Using Development Test Data

摘要：

Success ratio sequential sampling plan is a common test plan for reliability compliance test.The standard sampling inspection used in practical project for reliability compliance test is difficult for application due to the cost and total sample size, especially for complex systems.While the test data acquired in product development phase is abundant.Thus using these data in reliability compliance test can reduce sample size and cost This paper adopted a method called success ratio sequential sampling plan,which transformed the data acquired in product development phase to the equivalent actual data using similarity coefficient, and integrated the equivalent actual data to the real compliance test data using Bayesian statistical formula.A simulation revealed that the data acquired in product development phase could be effectively used and the sequential compliance test sample size could be reduced compared with the traditional compliance test.

关键词： Reliability Compliance Test Sequential Test Success Ratio Development Test Data

作者: Li Jin Shen Lijuan Zhao Lei

作者单位: Department of System Engineering of Engineering Technology Beihang University Beijing,P.R.China First Business Dept.China National Precision Machinery I/E Corp.Beijing,P.R.China

会议类型: 国际会议

会议名称: 2009 8th International Conference on Reliability,Maintainability and Safety(第八届中国国际可靠性、维修性、安全性会议)

会议地点: 成都

会议语种:英文

页码: 370-373

在线出版日期: 2009-08-24（万方平台首次上网日期，不代表论文的发表时间）