Precursor Parameter Identification for Power Supply Prognostics and Health Management

摘要：

Prognostics and health management (PHM) seeks to identify and isolate reliability problems in products (diagnostics) and predict a products remaining useful life (prognostics).In this paper, a four-step PIIM approach for power supplies is presented: 1) precursor parameter identification based on historical data analysis and failure mechanism analysis;2) baseline establishment by conducting experiments under different environmental and usage conditions and characterizing precursor parameters for healthy power supplies;3) baseline verification by conducting similar experiments for fielded power supplies;and 4) testing.Precursor parameter identification for one switch-mode power supply (SMPS) was carried out.The power metal-oxide semiconductor field-effect transistor, insulated-gate bipolar transistor, and the Schottky diode were identified as the majority cause by historical data analysis.Gate oxide leakage current, threshold voltage, transconductance, junction temperature,VCE (on), and contact resistance were determined to be monitored parameters for this SMPS after a failure mechanism analysis.

关键词： Prognostics Health Management Power Supply Precursor Failure Mechanism

作者: Huiguo Zhang Rui Kang Mingzhu Luo Michael Pccht

作者单位: Department of System Engineering Beihang University Beijing,China CALCE Center University of Maryland College Park,US

会议类型: 国际会议

会议名称: 2009 8th International Conference on Reliability,Maintainability and Safety(第八届中国国际可靠性、维修性、安全性会议)

会议地点: 成都

会议语种:英文

页码: 883-887

在线出版日期: 2009-08-24（万方平台首次上网日期，不代表论文的发表时间）