The Research on Fault Equivalent Analysis Method in Testability Ezperiment Validation

摘要：

With the existing fault injection techniques,many faults that can fully expose testability design defects can not be injected.To solve this problem, a method of fault equivalent analysis is proposed.By this means,some characteristics are extracted from the faults those unable to be injected, and yield analysis or yielded analysis is performed.Then the minimal cut sets of atom faults is obtained and selected,which arc finally equivalent to the atom faults sequence.Applications show that the method not only solves the problem that many faults arc not able to be injected,but also ensures the effect of testability experiment validation.

关键词： Testability ezperiment validation equivalent analysis fault characteristics fault to be injected atom fault

作者: Fuqun Huang Ping Xu Bin Liu Yue Li

作者单位: Department of System Engineering of Engineering Technology Beihang University Beijing,China

会议类型: 国际会议

会议名称: 2009 8th International Conference on Reliability,Maintainability and Safety(第八届中国国际可靠性、维修性、安全性会议)

会议地点: 成都

会议语种:英文

页码: 902-906

在线出版日期: 2009-08-24（万方平台首次上网日期，不代表论文的发表时间）