Research on the reliability of SLD through Accelerated Life Testing

摘要：

As an important component,Super Luminescent Diodc (SLD) is the most crucial factor that affects life and reliability of Intcrfcrotic Fiber Opitc Gyroscope (lFOG).Therefore,research on the reliability of SLD is the base of research on the reliability of IFOG.Research on the reliability of SLD was processed through accelerated life test (ALT).Based on related theoretic analysis, the sensitive stress was thus decided.By analyzing the failure mechanism and the configuration of SLD, an Arrhenius life-stress relationship was obtained,Le.the accelerated model.Using Weibull distribution as its life distribution function,reliability assessment was achieved applying MLE data assessment method.And reliability assessment results of SLD at 25C was gained.By analyzing the reliability assessment results,conclusion can be made that ALT on SLD is feasible.

关键词： Super Luminescent Diode reliability analysis accelerated life test Weibull distribution.

作者: Chao Daihong Ma Jing Li Xiaoyang

作者单位: School of Instrument Science and Opto-electronics Engineering Beihang University Beijing,China Department of System Engineering of Engineering Technology Beihang University Beijing,China

会议类型: 国际会议

会议名称: 2009 8th International Conference on Reliability,Maintainability and Safety(第八届中国国际可靠性、维修性、安全性会议)

会议地点: 成都

会议语种:英文

页码: 1263-1267

在线出版日期: 2009-08-24（万方平台首次上网日期，不代表论文的发表时间）