Investigation in Lifetime Evaluation of Electron Multiplier Based on Step Stress Accelerated Degradation Test in a Two-way Design

摘要：

In order to evaluate lifetime of electron multiplier (EM),which is a key component of a cesium atomic frequency standard system,step stress accelerated degradation test in a two-way design is presented.The investigation of test design,establishment of lifetime evaluation model and model analyses is made.Then lifetime evaluation of EM is carried out.

关键词： Double step stress accelerated degradation test (DSSADT) Lifetime evaluation EM Reliability

作者: Yongqiang Mo Yongpan Hu Yashun Wang Chunhua Zhang Xun Chen

作者单位: College of Mechatronic Engineering and Automation National Univ.of Defense Technology Chang sha 4100 College of Mechatronic Engineering and Automation.National Univ.of Defense Technology Chang sha 4100

会议类型: 国际会议

会议名称: 2009 8th International Conference on Reliability,Maintainability and Safety(第八届中国国际可靠性、维修性、安全性会议)

会议地点: 成都

会议语种:英文

页码: 1307-1312

在线出版日期: 2009-08-24（万方平台首次上网日期，不代表论文的发表时间）