Fault-based Test Case Generation for Component Connectors
The complex interactions appearing in serviceoriented computing make coordination a key concern in serviceoriented systems. In this paper, we present a faultbased method to generate test cases for component connectors from specifications. For connectors, faults are caused by possible errors during the development process, such as wrongly used channels, missing or redundant subcircuits, or circuits with wrongly constructed topology. We give test cases and connectors a unifying formal semantics by us ing the notion of design, and generate test cases by solving constraints obtained from the specification and faulty con nectors. A prototype symbolic test case generator serves to demonstrate the automatizing of the approach.
Bernhard K. Aichernig Farhad Arbab Lǎcrǎmioara Astefǎnoaei Frank S. de Boer Sun Meng Jan Rutten
UNU-IIST, P.O.Box 3058, Macao S.A.R., China Institute for Software Technology, Graz University of Te CWI, Kruislaan 413, Amsterdam, The Netherlands
国际会议
天津
英文
147-154
2009-07-29（万方平台首次上网日期，不代表论文的发表时间）