Research on Thickness Measurement of Transparent Object Based on CCD Vision System

摘要：

Novel thickness measurement of transparent object based on line-structured laser and CCD vision technique is present in this paper. The measurement of light stripe image distance is transformed from the measurement of thickness. This article focuses on the experiment design, and the factors that influence accuracy of measurement are discussed as well. The research with positive laboratory verification has proven the feasibility and validity of photoelectric measurement of transparent object thickness. The resolution of thickness measurement can be 8.2μm.

关键词： transparent object thickness CCD central orientation

作者: Yang Ni Wang Yu-tian Lv jiang-tao Li huan-huan

作者单位: MTI Key Lab of Hebei Province Yanshan University Qin Huangdao,China Environmental Protection Shandong Hisense Environmental Protection Co.Ltd Ji Nan,China

会议类型: 国际会议

会议名称: 2009 International Conference on Measuring Technology and Mechatronics Automation(ICMTMA 2009)(2009年检测技术与机械自动化国际会议)

会议地点: 长沙

会议语种:英文

页码: 113-116

在线出版日期: 2009-04-11（万方平台首次上网日期，不代表论文的发表时间）