会议专题

Research on Optimizing Build Parameters for Stereolithography Technology

The dimension accuracy in scanning plane of high resolution stereolithography (SL) system with building parameters (laser beam scanning speed (factor A), cured line width compensation (factor B), hatch spacing (factor C) and the coefficient of resins shrinkage compensation (CRSC, factor D)) were investigated in this study. A L27orthogonal array and signal-to-noise (S/N) were employed to analyze the effect of building parameters. Using Taguchi method for design of a robust experiment, the interactions among factors are also investigated. The experimental results indicate that hatch spacing, CRSC and A~C are recognized to make the most significant contribution to the overall performance. For the dimension accuracy, the optimal combination building parameters is A2B1C2DI (i.e. laser beam scanning speed:450mm/s, cured line width compensation:0.02mm, hatch spacing:0.04mm, CRSC:l.025). With the optimal factors combination, an error of 0.003ram in scanning plane has been reached using the high-resolution SL system. Confirmation experiment results showed that the dimension accuracy has been significantly improved with the optimal factors combination.

rapid prototyping stereolithography dimension accuracy optimizing build parameters taguchi method

Xu Guangshen Jin Jing Luo Sheng Qiu ronghua Pan Huan

School of Mechanical Engineering Xian Polytechnic University Xian,China

国际会议

2009 International Conference on Measuring Technology and Mechatronics Automation(ICMTMA 2009)(2009年检测技术与机械自动化国际会议)

长沙

英文

1827-1830

2009-04-11(万方平台首次上网日期,不代表论文的发表时间)