Scattering Parameters Measuring Technology Research on Two-port Surface Mounted Device

摘要：

This paper derives a novel principle how to design the fixture and the standard kit from the physical structure of surface mounted device (SMD). The characteristic coefficients of the standard are described. A perfect de-embedding algorithm is implemented. Then an example of two port surface acoustic wave (SAW) filter scattering parameters (S-parameters) measurement is used to show how to design the fixture and the calibration kit by applying the de-embedding algorithm.

作者: Hui Huang Ke Wang Xin Meng Liu Xin Lv

作者单位: Beijing Institute of Technology,Beijing 100081,China National Institute of Metrology,Beijing 100013, China Electronic Standardization Institute,Beijing 100007,China National Institute of Metrology,Beijing 100013,China Beijing Institute of Technology,Beijing 100081,China

会议类型: 国际会议

会议名称: Progress in Electromagnetics Research Symposium 2009(2009年电磁学研究新进展学术研讨会)(PIERS 2009)

会议地点: 北京

会议语种:英文

页码: 1364-1367

在线出版日期: 2009-03-23（万方平台首次上网日期，不代表论文的发表时间）