Eztraction of Complez Permittivity of Multilayered Dielectric Sample Loaded in a Rectangular Waveguide
Complex permittivity of dielectric materials loaded in the cross section of a rectangular waveguide can be determined from the S-parameter measurements of the discontinuity. The analytical electromagnetic tool used to solve the scattering problem of dielectric loaded waveguide is mode matching method. Minimization of an error function to extract the unknown complex permittivity of the material is done using a practical Quasi-Newton algorithm.
Uma Balaji
Electrical & Computer Engineering Department,California State University Chico,CA 95929,USA
国际会议
Progress in Electromagnetics Research Symposium 2009(2009年电磁学研究新进展学术研讨会)(PIERS 2009)
北京
英文
1657-1660
2009-03-23(万方平台首次上网日期,不代表论文的发表时间)