会议专题

Test procedures and artefacts for optical coordinate metrology

Optical measurements are performed in coordinate metrology in a wide range of applications, ranging from large-scale workpieces with dimensions of several meters down to microstructures with μm-dimensions, using a large number of different measurement devices and sensors. These different devices and sensors must be tested to check their compliance with the specifications, to trace back the measurement results and to compare different devices. Thus, appropriate procedures and measurement standards (artefacts) are necessary. We present test procedures and artefacts for optical measurement systems similar to the well-known test procedures for classical tactile coordinate measuring machines (CMMs) according to the international standard ISO 10360 1. It is important that the surface characteristic of the artefacts is cooperative to the sensor. Appropriate artefacts were realized and tested. The main focus of this paper is on micro-artefacts. Furthermore, task-related standards to trace back specific measurement tasks were developed. By means of micro-contour artefacts, the measurement characteristics on critical geometries can be evaluated and compared. By means of a micro-gear standard, the measurement uncertainty on micro-planetary gear can be evaluated. The measurement deviations of measurement systems in the automotive industry can be determined with the special artefacts to test sensors for inline measurements.

coordinate metrology optical sensors test procedures measurement standards artefacts traceability

Ulrich Neuschaefer-Rube Wiebke Ehrig Michael Neugebauer Klaus Wendt

Physikalisch-Technische Bundesanstalt (PTB), Braunschweig und Berlin,Bundesallee 100, D-38116 Brauns Physikalisch-Technische Bundesanstalt (PTB), Braunschweig und Berlin, Bundesallee 100, D-38116 Braun

国际会议

第五届仪器科学与技术国际学术会议(ISIST 2008)Fifth International Symposium on Instrmentation Science and Technology

沈阳

英文

1-9

2008-09-15(万方平台首次上网日期,不代表论文的发表时间)