Measurement of nano-particles size by evanescent interference field with conventional optical microscope

摘要：

The size of a particle smaller than the diffraction limit is measured using a conventional optical microscope by adopting a standing wave evanescent field illumination. The scattering intensity from a nanoparticle is periodically modulated by shifting the intensity fringes of standing evanescent field. By measuring the intensity variation of scattered light during one cycle of modulation, particle sizes can be easily estimated. Furthermore, this technique has weak dependence on the material of particles. From the experimental result, the particle size ranging from 20 to 250 nm is successfully determined. This technique offers a low-cost size measurement for nanoparticles.

关键词： Evanescent interference field Total internal reflectio nmicroscopy Geometric phase shifter super resolutio nmicroscopy

作者: Xiang Yu Yukihiro Araki Kentaro Iwami Norihiro Umeda

作者单位: Division of Advanced Mechanical Systems Engineering, Tokyo University of Agriculture andTechnology, Division of Advanced Mechanical Systems Engineering, Tokyo University of Agriculture and Technology,

会议类型: 国际会议

会议名称: 第五届仪器科学与技术国际学术会议(ISIST 2008)Fifth International Symposium on Instrmentation Science and Technology

会议地点: 沈阳

会议语种:英文

页码: 1-6

在线出版日期: 2008-09-15（万方平台首次上网日期，不代表论文的发表时间）