Near-field birefringence response of IPS liquid crystal thin film detected by Bi-SNOM
Dynamics information of nematic liquid crystal (NLC) in In-Plane-Switching (IPS) mode is attractive and important for applications of high vision angle techniques. In this paper, we used a novel evaluation method to detect the molecular orientation dynamics of NLC thin film in depth direction from its birefringence responses using birefringence scanning near-field optical microscopy (Bi-SNOM). In this method, a Bi-SNOM probe is inserted into IPS mode NLC thin film, in which the time responses of LC molecules at different position in depth are also measured. In addition, Molecular orientation hysteresis to the applied voltage is observed. We measured the orientation hysteresis of LC molecules at different position along the depth direction in the LC thin film. Experimental results show that the proposed method is effective and feasible for its consistence with original specialities.
IPS hysteresis time response orientation anchoring strength birefringence SNOM
Jing Qin Norihiro Umeda
Faculty of Engineering, Tokyo University of Agriculture and Technology, 2-24-16 Naka-cho, Koganei, T Faculty of Engineering, Tokyo University of Agriculture and Technology, 2-24-16 Naka-cho, Koganei,
国际会议
第五届仪器科学与技术国际学术会议(ISIST 2008)Fifth International Symposium on Instrmentation Science and Technology
沈阳
英文
1-9
2008-09-15（万方平台首次上网日期，不代表论文的发表时间）