Positron Lifetime Imaging with a Positron Probe Micro Analyzer

摘要：

Positron annihilation lifetime spectroscopy (PALS) with slow positron beam is a powerful technique for evaluating vacancy-type defects near the surface. In general, the spot sizes of slow positron beams are larger than a few mm, hence, they require samples larger than～10 mm2. In order to apply PALS to very small samples, or samples with small features of interest, a positron probe micro analyzer (PPMA) has been developed using a LINAC-based intense positron beam in AIST.

作者: N.Oshima R.Suzuki T.Ohdaira A.Kinomura T.Narumi A.Uedono M.Fujinami

作者单位: National Institute of Advanced Industrial Science and Technology (AIST),AIST-Central 2,1-1-1,Umezono Graduate School of Pure and Applied Science,University of Tsukuba,1-1-1,Ten-no dai,Tsukuba,Ibaraki 3 Department of Applied Chemistry,Chiba University,1-33,Yayoi-cho,Inage,Chiba-shi,Chiba 263-8522,Japan

会议类型: 国际会议

会议名称: 第九届国际正电子与正电子素国际会议(9th International Workshop on Positron and Positronium Chemistry)(PPC–9)

会议地点: 武汉

会议语种:英文

页码: 40

在线出版日期: 2008-05-11（万方平台首次上网日期，不代表论文的发表时间）