Positron Beam Characterization of Silica and Titania Thin Films with Structurally Ordered Porosity

摘要：

Surfactant-templated silicon and titanium oxide thin films with tailored mesopore stuctures and high surface area have atrract great interest in recent years, as favoring industiral application in the fields of ultra-large scale integrated circuits and dye-sensitized solar cells, respectively. Positron annihilation lifetime and Doppler broadening as well as positronium time-of-flight measurements based on a positron beam have been frequently utilized as powerful techniques to characterize the pore size, pore interconnectivity, (open) porosity, pore inner-surface chemistry as well as pore tortuosity for thin silica films with random pore orientation 1.

作者: R.S.Yu X.B.Qin Q.Z.Wang D.N.Wang Y.R.Zhong Z.Zhang Z.X.Li B.Y.Wang L.Wei

作者单位: Institute of High Energy Physics,Chinese Academy of Sciences,Beijing 100049,China

会议类型: 国际会议

会议名称: 第九届国际正电子与正电子素国际会议(9th International Workshop on Positron and Positronium Chemistry)(PPC–9)

会议地点: 武汉

会议语种:英文

页码: 43

在线出版日期: 2008-05-11（万方平台首次上网日期，不代表论文的发表时间）