Non-destructive characterisation of vertical ZnO nanorod arrays by slow positron implantation spectroscopy, atomic force microscopy, and photoluminescence
ZnO is of considerable interest for optoelectronic device applications due to its wide band gap and high exciton binding energy. Among various fabrication methods available for ZnO nanostructures, hydrothermal synthesis is of the greatest interest due to its low fabrication temperature and low cost. Such ZnO nanorods have already been successfully characterized by slow positron implantation spectroscopy (SPIS) and atomic force microscopy (AFM) 1. However, the material quality of rods grown this way is often inferior to vapour deposited samples.
G.Brauer A.B.Djurisic W.Anwand W.Skorupa I.Beynik C.Teichert Y.F.Hsu Y.Y.Xi C.Y.Zhu C.C.Ling
Institut für Ionenstrahlphysik und Materialforschung,Forschungszentrum Dresden-Rossendorf,01314 Dres Department of Physics,University of Hong Kong,Pokfulam Road,Hong Kong,P.R.China Institut für Physik,Montanuniversit(a)t Leoben,Franz Josef Str.18,A-8700 Leoben,Austria
国际会议
第九届国际正电子与正电子素国际会议(9th International Workshop on Positron and Positronium Chemistry)(PPC–9)
武汉
英文
46
2008-05-11(万方平台首次上网日期,不代表论文的发表时间)