Free volume evolution in Si ion irradiated Polyethersulphone studied by positron annihilation lifetime spectroscopy
Free volume properties of polymeric materials changes with Swift Heavy Ion (SHI) irradiation. The change depends on the polymer and ion, its energy and fluence. Free volume is found to have strong correlation with the macroscopic properties of the polymer. Positron Annihilation Lifetime Spectroscopy (PALS) has recently emerged as a unique non-destructive and non-interfering nano-probe, capable of measuring the free volume hole size in polymers with high detection efficiency1, 2. In the present study Polyethersulphone (PES) films of thickness 250 μm were irradiated with Si8+ ions of energy 100 MeV from 15 UD Pelletron accelerator at Inter University Accelerator Centre(IUAC), New Delhi, India to the fluences of 1010, 1011, 1012 and 5x1012 ions/cm2. Characterization of the effect of ion irradiation on free volume has been carried out by Positron Annihilation Lifetime Spectroscopy. From o-Ps lifetime mean free volume hole radius, average free volume of micro voids and fractional free volume are computed. Free volume is found to decrease with the fluence. With the increase in the fluence, scissioned segments crosslink randomly, resulting in to the decrease of average free volume due to overlapping of tracks. Results will be discussed.
Rajesh Kumar S.Asad.Ali H.S.Virk S.K.Chaudhary D.Das D.K.Avasthi Rajendra Prasad
Department of Applied Physics,Z.H.College of Engineering & Technology,Aligarh Muslim University,Alig 360 Sector-71,SAS Nagar (Mohali),Chanigarh-160071,India UGC-DAE Consortium for Scientific Research,Kolkata-700098,India Inter University Accelerator Centre,Aruna Asaf Ali Marg,New Delhi-110067,India
国际会议
第九届国际正电子与正电子素国际会议(9th International Workshop on Positron and Positronium Chemistry)(PPC–9)
武汉
英文
67
2008-05-11（万方平台首次上网日期，不代表论文的发表时间）