Microdefects in carbon allotropes studied by positron annihilation techniques
The microdefects of graphite, nanophase C, and diamond films have been investigated by positron annihilation techniques. The experimental results show that the S parameter of nanophase C is higher than that of graphite, that is the concentration of defects in nanophase C is higher than that in graphite. The S parameters of nanophase C decrease with the increasing of positron implantation energy, and reach a minimum value at positron implantation energy of 1 keV, then increase with positron implantation energy. This implies that defects near to the surface layer of nanophase C may absorb hydrogen and gives rise to the decrease of S parameter and the content of hydrogen decreases with the increase of the distant from the surface.
Huang Yu-Yang Chen Zhen-Ying Wei Ya-Qin Li Yu-Xia Deng Wen
Department of Physics,Guangxi University,Nanning 530004,P.R.China
国际会议
第九届国际正电子与正电子素国际会议(9th International Workshop on Positron and Positronium Chemistry)(PPC–9)
武汉
英文
101
2008-05-11(万方平台首次上网日期,不代表论文的发表时间)