会议专题

Positron annihilation on the surface of single crystals of Si, SiO2,graphite and Cu

Mono-energetic slow positron beam has been applied to measure the Doppler broadening spectra of positron annihilation radiation for single crystals of Si, SiO2, graphite and Cu. The experimental results show that the S parameter for the single crystal of SiO2 (quartz) is lower than that for the single crystal of Si, and the W parameter for the single crystal of SiO2 is higher than that for the single crystal of Si. This can be due to the existance of O atoms in the quartz and positrons annihilating with electrons of O atoms. The S parameters for single crystals of SiO2, graphite and Cu decrease with the increasing of positron implantation energy.

Deng Wen Yue Li Li Yu-Xia Cheng Xu-Xin Wei Ya-Qin Huang Yu-Yang

Department of Physics,Guangxi University,Nanning 530004,P.R.China

国际会议

第九届国际正电子与正电子素国际会议(9th International Workshop on Positron and Positronium Chemistry)(PPC–9)

武汉

英文

107

2008-05-11(万方平台首次上网日期,不代表论文的发表时间)