Studying Polyamide Water Separation Film Using Slow Positron Beam

Positron annihilation spectroscopy, coupled with slow positron beam was used to study the depth profile of thin polyamide water separation films polymerized under different conditions. Films were prepared by interfacial polymerization of Ethylenediamine (EDA) and Trimesoylchloride (TMC) on the modified Polyacrylonitrile (mPAN) substrates. Different concentrations of EDA were used to modify the crosslink densities. By using the slow positron beam, depth profiles of relative hole sizes for different films were obtained. It is clearly demonstrated that the hole size at the surface layer is much smaller than that in the mPAN substrate layer. In addition, the hole size at the surface layer increases slightly by the changing the concentration of EDA from 0.5 wt% to 5 wt%, but seriously collapses when the concentration of EDA reaches 10 wt%. The results will be discussed in correlation with those from other techniques as FTIR, TEM and water permeability test experiments.
R.Zhang P.M.Johnson B.Landfair Y.C.Jean C.C.Hu
Department of Physical Science,Southern Utah University,351 W University Blvd.,Cedar City,UT 84720 U Department of Chemistry,University of Missouri – Kansas City 5009 Rockhill Rd.Kansas City,MO 64110 U R & D Center for Membrane Technology,Chung Yuan Christian University 200,Chung Pei Rd.,Chung Li,Taiw
国际会议
第九届国际正电子与正电子素国际会议(9th International Workshop on Positron and Positronium Chemistry)(PPC–9)
武汉
英文
112
2008-05-11(万方平台首次上网日期,不代表论文的发表时间)