Defect study of as-grown single crystal ZnO by positron
Positron lifetime spectroscopy (PAS) and Coincidence Doppler broadening measurements have been performed in as-grown and annealing single crystal ZnO. The temperature dependence observed in annealed ZnO indicates that the defect is removed during annealing. By combining the Doppler broadening measurements, we infer that there isn′t hydrogen filling the zinc vacancy site in the as-grown ZnO due to the same characteristics in CDB for as-grown and annealed ZnO samples.
positron Coincident Doppler broadening ZnO defect
Ke Junyu Li Hui Pang Jinbiao Dai Yiqun Wang Zhu Zhao Youwen
School of Physics and Technology,Wuhan University,Wuhan 430072,Hubei,China Institute of Semiconductors,Chinese Academy of Science,Beijing 100083,China
国际会议
第九届国际正电子与正电子素国际会议(9th International Workshop on Positron and Positronium Chemistry)(PPC–9)
武汉
英文
143-145
2008-05-11(万方平台首次上网日期,不代表论文的发表时间)