Formation of Ordered Pores Determined by Positronium Time of Flight Spectroscopy

摘要：

We prepared a series of mesoporous silica films to study the structural information of ordered pores by positronium Time of Flight (Ps-TOF) spectroscopy. By changing the ratio of surfactant to silicon source, the pore structure is tuned. Results show that once ordered pores are formed, clear Ps TOF peak is observed. And the film with less distributed pore geometry leads to a narrowed Ps TOF peak.

关键词： Positronium Time-of-Flight (TOF) spectroscopy Evaporation Induced Self-Assembly

作者: Xiu-Bo Qin Run-Sheng Yu Toshikazu Kurihara Xing-Zhong Cao Bao-Yi Wang Long Wei

作者单位: Institute of high energy physics,Chinese Academy of Sciences,Beijing,100049,China;Graduate Universit Institute of high energy physics,Chinese Academy of Sciences,Beijing,100049,China High Energy Accelerator Organization (KEK) Tsukuba,Ibaraki,305-0801,Japan

会议类型: 国际会议

会议名称: 第九届国际正电子与正电子素国际会议(9th International Workshop on Positron and Positronium Chemistry)(PPC–9)

会议地点: 武汉

会议语种:英文

页码: 201-203

在线出版日期: 2008-05-11（万方平台首次上网日期，不代表论文的发表时间）