Latest Trends in Millimeter-wave Imaging Technology

摘要：

This paper overviews the latest trends of millimeter-wave (MMW) imaging tech-nologies, focusing mainly on applications of and technical parameter variations for security surveillance and nondestructive inspections (NDI). We introduce a smart NDI tool using active W-band imaging, which is capable of detecting hidden surface cracks in concrete structures.

作者: S.Oka H.Togo N.Kukutsu T.Nagatsuma

作者单位: NTT Microsystem Integration Laboratories 3-1,Morinosato Wakamiya Atsugi-shi,Kanagawa 243-1908,Japan

会议类型: 国际会议

会议名称: Progress in Electromagnetics Research Symposium 2008(2008年电磁学研究新进展学术研讨会)(PIERS 2008)

会议地点: 杭州

会议语种:英文

页码: 1-4

在线出版日期: 2008-03-24（万方平台首次上网日期，不代表论文的发表时间）