Identification of Defects in Materials with Surface Conductivity Distribution
The images of the electrical surface conductivity distribution can be reconstructed from the voltage measurement captured on the boundaries of an object. This very well known technique is named Electrical Impedance Tomography. The image reconstruction problem is an ill-posed inverse problem of finding such conductivity σs that minimizes some optimisation criterion, which can be given by a suitable primal objective function. This paper describes new algorithms based on stochastic methods to be used for the acquirement of more accurate reconstruction results and stable solution. The proposed methods are expected to non-destructive test of materials. It will be shown examples of the identification of voids or cracks in special structures called honeycombs. Instead of the experiments we used phantom evaluated voltage values based on the application of finite element method. The advantages of a new approach are compared with properties of a deterministic approach to the same image reconstructions.
J.D(e)dková
Department of Theoretical and Experimental Electrical Engineering Brno University of Technology Kolejní 2906/4,Brno 612 00,Czech Republic
国际会议
Progress in Electromagnetics Research Symposium 2008(2008年电磁学研究新进展学术研讨会)(PIERS 2008)
杭州
英文
1-5
2008-03-24（万方平台首次上网日期，不代表论文的发表时间）