Free-Space Electromagnetic Characterization of Materials for Microwave and Radar Applications
Characterization of the electrical material properties εr,μr and tan δ is of prime importance for all microwave and antenna design applications. Experimental “S parameters in wide frequency band are used. Problem related to the calibration elements,calibration references planes and the thickness samples (d) are reported. Problem of calibration can be avoided by using noncontact free space electromagnetic characterization based on the measurement of the insertion transfer function. This method allows spatial correction of the experimental set-up. Problem of the sample thickness (d) is essentially due to the existence of multiple solutions when solving the set of basis equations with S21,S11,εr and μr. This is the principal reason why some algorithms give spurious solutions or didn t converge. In this work,we developed a method combining several solutions suggested otherwise based on: -Free-space electromagnetic characterization associated with an adapted wave-guide LRL (“line-reflectline) calibration method in the 8-12GHz X band range,-Insertion mode to correct spatial dependence of the transfer function (S21),-An electrical E-wall to correct the phase of the reflection parameter (S11),-A supplementary criterion on loss material is used to obtain a unique solution. We have experimentally characterized a 50mm thick dielectric material and extracted its relative permittivity in the X band. The obtained results are in excellent agreement with the known value.
Habiba Hafdallah Ouslimani Redha Abdeddaim Alain Priou
University Paris X,Ville d’Avray,France
国际会议
Progress in Electromagnetics Research Symposium 2005(2005年电磁学研究新进展学术研讨会)(PIERS 2005)
杭州
英文
128-132
2005-08-22（万方平台首次上网日期，不代表论文的发表时间）