Figure of Merit and Limiting Characteristics of Tunable Ferroelectric Microwave Devices

摘要：

Microwave application of ferroelectrics is very promising for electrically tunable microwave devices based on the electric field dependence of the dielectric permittivity. Tunable filters and controllable phase shifters are successfully designed as integrated circuits based on multilayer structures containing thin epitaxial ferroelectric (FE) film. As a rule lumped ferroelectric capacitors are used as the tunable components. Quality of the capacitor can be evaluated using Commutation Quality Factor (CQF). There is a unique connection between the Figure of Merit of a tunable microwave device and the CQF of the FE capacitors used. The Figure of Merit gives the upper limit of the quality of a tunable device based on the FE components.

作者: I.Vendik V.Pleskachev O.Vendik

作者单位: St.Petersburg Electrotechnical University,Russia

会议类型: 国际会议

会议名称: Progress in Electromagnetics Research Symposium 2005(2005年电磁学研究新进展学术研讨会)(PIERS 2005)

会议地点: 杭州

会议语种:英文

页码: 327-330

在线出版日期: 2005-08-22（万方平台首次上网日期，不代表论文的发表时间）