Nano-Magnetic Structures Characterization in Thin Films

摘要：

The driving force for developments in nano-technology results from the increasing demand related to key technologies like microelectronics and nano magnetic devices. In decreasing scale of many devices,high-resolution characterization methods have become of fundamental importance for further development in nano technologies. The availability of powerful microscopy methods,is certainly important for the development of new and functional materials. The characterization of materials at various and increasing levels of resolution,structures,microstructure, and defect geometry, as well as chemical composition and spatial distribution are important parameters determining the behavior of materials and practical applications.

作者: D.Bajalan

作者单位: Vienna University of Technology,Austria

会议类型: 国际会议

会议名称: Progress in Electromagnetics Research Symposium 2005(2005年电磁学研究新进展学术研讨会)(PIERS 2005)

会议地点: 杭州

会议语种:英文

页码: 669-671

在线出版日期: 2005-08-22（万方平台首次上网日期，不代表论文的发表时间）