The Design of a Multifunctional Test Apparatus-LISN Used for Conduction Interference Testing

摘要：

This paper introduces a conduction interference test apparatus. It mainly introduces the conduction interference testing circuit - LISN and hardware design of the function circuit, such as: L/N line selection circuit. limiter circuit and the interface circuit between RS232 and computer.

关键词： LISN limiter circuit RS232

作者: Lingling Yue Xiaodong Zhang

作者单位: School of Electrical Engineering Beijing Jiaotong University Beijing, China

会议类型: 国际会议

会议名称: 2009 3rd IEEE International Symposium on Microwave,Antenna,Progagation and EMC Technologies for Wireless Communications(第三届微波、天线、电波传播和EMC技术国际会议

会议地点: 北京

会议语种:英文

页码: 882-884

在线出版日期: 2009-10-27（万方平台首次上网日期，不代表论文的发表时间）