Design and Analysis for Electromagnetic Low Voltage Apparatus Multiple Factor Reliability Ezperiment

摘要：

Low voltage apparatus reliability experiment was affected by many factors, such as ambient temperature, dampness, current through contactor, operation frequency etc. In this paper, the basic theories of Latin square design based on combinatorial mathematics were studied first, and on the basis of the theories, we gave an the analysis process of a concrete example. The research indicated that the methodology has unique advantage for low voltage apparatus multiple factor reliability experiment.

关键词： low voltage apparatus reliability multiple factor reliability ezperiment statistic analysis

作者: Chen Peng Wang Tuoyu Wang Haitao

作者单位: HUYU Group Corporation, Zhejiang, 325603 Hebei University of Technology, Tianjin, 300130 HUYU Group Corporation, Zhejiang, 325603 Hebei University of Technology, Tianjin, 300130

会议类型: 国际会议

会议名称: 第三届电工产品可靠性与电接触国际会议(The 3rd International Conference on Reliability of Electrical Products and Electrical Contacts)

会议地点: 温州

会议语种:英文

页码: 421-424

在线出版日期: 2009-10-18（万方平台首次上网日期，不代表论文的发表时间）