Study of Test of Checking and Accepting Reliability Judging Method on High Reliability Electronics System

摘要：

Based on static and historical data technology, this paper puts forward small scale test of checking and accepting reliability judging technology by researching environment converting factor and synthetically technology of count data and metric data. This paper studies data trend assured method based on contractive estimating and weight coefficients, and analyzes multi-information reliability fusing theory. Finally this paper puts forward test of checking and accepting reliability judging method of high reliability electronics system.

关键词： Electronic system Small scale Test of checking and accepting Reliability judging

作者: Huang Jingde Duan Lizhao

作者单位: Dalian Naval Academy, Dalian, 116018, China Dalian Naval Academy, Dalian,116018, China

会议类型: 国际会议

会议名称: 第三届电工产品可靠性与电接触国际会议(The 3rd International Conference on Reliability of Electrical Products and Electrical Contacts)

会议地点: 温州

会议语种:英文

页码: 495-497

在线出版日期: 2009-10-18（万方平台首次上网日期，不代表论文的发表时间）