Aging Process Effects on MgO Protective Layer
The PDP panels of the SM-PDP type and large discharge area test samples with doped MgO film were prepared. The effect of the aging process on F-center defects and the microstructural change of the MgO protective layer in SMPDP were investigated. The SEM and XRD results show that the surface microstructure of the MgO has been re-crystallized, but the crystal structure orientation is almost maintained. Visible light emission spectra, recorded during the aging process, show that the intensity of F/F+ center emission is reduced during the aging process which is helpful to get stable addressing.
aging MgO microstructure F center F+ center emission
Qing Li Yinxin Shi Yawei Kuang Harm Tolner
College of Electronic Science and Engineering of Southeast University, Nanjing, P.R.China, 210096 Institute of Electronic Devices of Nanjing, P.R.China, 210016
国际会议
The 11th Asian Symposium on Information Display(ASID09)(第11届亚洲信息显示会议)
广州
英文
113-116
2009-10-07（万方平台首次上网日期，不代表论文的发表时间）