Error Current Effects in Current-Programmed Pizel Circuits For AMOLED

摘要：

In this paper, we study the effects of error current in a-Si:H thin film transistor (TFT) based current-programmed pixel circuit for active matrix organic light emitting displays (AMOLEDs). It is found that during the operation time the voltage drops by clock feed through and charge injection are the main reasons for the error current. And, the error current strongly depends on the leakage of switch TFT during the holding time. In addition, we have also analyzed the error current arising from long-time instabilities of TFTs and the shift of threshold voltages in the driving TFTs.

关键词： Active matriz display organic light emitting diode current-programmed pizel circuit error current

作者: Yinan Liang Congwei Liao Changde He Shengdong Zhang

作者单位: Shenzhen Graduate School, Peking University, Shenzhen 518055, P.R.China Institute of Microelectronics, Peking University, Beijing 100871, P.R.China Shenzhen Graduate School, Peking University, Shenzhen 518055, P.R.China Institute of Microelectronic

会议类型: 国际会议

会议名称: The 11th Asian Symposium on Information Display(ASID09)(第11届亚洲信息显示会议)

会议地点: 广州

会议语种:英文

页码: 152-155

在线出版日期: 2009-10-07（万方平台首次上网日期，不代表论文的发表时间）