An Optimization Method to Overcome the Thickness Effect to Dual-Energy Transmission Imaging
To classify different materials from the images by dual-energy X-ray transmission, the current method to calculate the eigenvalue R relating to effective atomic number is combining the high-energy transmission signal with low-energy one. But, the thickness of object affects greatly the R value. So, a ratio of the two transmission signals is proposed to eliminate the effect of object thickness instead, i.e., an optimal numerical computation by which the optimized transmission signals can be obtained through compound Simpsons rule to estimate area absorption coefficient. Analyzing the test data and error probability, the method proposed is proved available to minimize the thickness effect with lee mistake, thus improving the veracity in classifying materials.
dual-energy z-ray detection security inspection effective atomic number object classification energy selection
SUN Li-na
School of Mechanical Engineering and Automation, Northeastern University Shenyang, China
国际会议
沈阳
英文
434-441
2009-08-24（万方平台首次上网日期，不代表论文的发表时间）