Key Technology Research On anti-High Overload Electronic Recorder

摘要：

Anti-high overload electronic data recorder is used to record overload parameters of the penetration process, the flying posture parameters of the bomblets, the remote metering data of the missile and other important parameters. It is of great significance because it can provide a theoretical basis for weapon systems development and improvement. However, how electronic data recorder can withstand the impaction overload of the blast or even the armor-piercing is the most important Prere- quisite for shell-containing recorders to access data. The cost of weapon systems test is very expensive, so high reliability of the electronic data recorder is required. In this paper, based on dynamic testing technology, we presented a high reliability key technology for anti-high overload electronic recorder with FLASH memory, FPGA-based controller and multi-channel high-speed A/D converter.

关键词： Anti-high overload FLASH memory FPGA Reliability

作者: Wen Feng Yang Zhiyong

作者单位: National Key Laboratory of Electronic Measurement Technology, North University of China, Taiyuan, Sh Key Laboratory of Instrumentation Science & Dynamic Measurement(North University of China),Ministry

会议类型: 国际会议

会议名称: 第八届国际测试技术研讨会(8th International Symposium on Test and Measurement)

会议地点: 重庆

会议语种:英文

页码: 27-30

在线出版日期: 2009-08-01（万方平台首次上网日期，不代表论文的发表时间）