Uses of the Bundary scan idea to realize the analog circuit performance testing

摘要：

The application of Boundary scan technology in digital circuit testing has already became mature,the application of its is limited to a great extent in analog circuit.difficulty and possibility in the application of Bundary scan technology used in the analog cicuit is mainly discussed,meanwhile a test project about analog circuitcapabilitis and parameters is presented by using the Boundary scan ideas.

关键词： Boundary scan analog circuit IEEE1149.4 standard DFT

作者: FENG Changjiang CUI Wei ZHAO Dongfang

作者单位: Central Laboratory of Electrician and Electronics, Mechanical Engineering College, Shijiazhuang, Hebei, 050003, China

会议类型: 国际会议

会议名称: 第八届国际测试技术研讨会(8th International Symposium on Test and Measurement)

会议地点: 重庆

会议语种:英文

页码: 47-50

在线出版日期: 2009-08-01（万方平台首次上网日期，不代表论文的发表时间）