Boundary-scan test realization based on embedded system

摘要：

For better application of Boundary-Scan technology on modern circuit testing,we have designed Boundary-Scan test system based on embedded system..The whole system is based on IEEE1149.1 Boundary Scan structure and test access port standard.The system involves Boundary-Scan software based on embedded system and Boundary Scan test instrument. Boundary Scan software based on embedded system make Boundary Scan test more agile,meanwhile the time of Boundary Scan testing will be shortened because simulation timing is produced by hardware in Boundary-Scan test instrument.

关键词： Boundary scan embedded system state machine command register

作者: CUI Wei FENG Chang-Jiang MAO Zhijun

作者单位: Central Laboratory of Electrician and Electronics Shijiazhuang Hebei China050003 Training Department Mechanical Engineering College.Shijiazhuang Hebei China050003

会议类型: 国际会议

会议名称: 第八届国际测试技术研讨会(8th International Symposium on Test and Measurement)

会议地点: 重庆

会议语种:英文

页码: 283-286

在线出版日期: 2009-08-01（万方平台首次上网日期，不代表论文的发表时间）