Design of The Testability Inspecting System for Certain Type Electronic Equipment

摘要：

It may take a great deal time and effort to analyze the inherent testability of electronic equipment by the traditional ways, for it needs too many experiments and statistics. Using the method of immitting faults to the simulational electrocircuit, many experiments can be done on the computer simulatively, and the conclusion could be given conveniently and swiftly. In the paper, the feasibility of this method is validated, basing on which, the design of the inherent testability inspecting system for certain type electronic equipment is discussed.

关键词： Testability Testability Inspect Electronic Equipment design

作者: Jiang Wei-xue Li Zong-liang Tang Yong-Gang Yuan yuan

作者单位: Department 1 of Guilin Air Force College, Guilin Guangxi 541003,China

会议类型: 国际会议

会议名称: 第八届国际测试技术研讨会(8th International Symposium on Test and Measurement)

会议地点: 重庆

会议语种:英文

页码: 307-310

在线出版日期: 2009-08-01（万方平台首次上网日期，不代表论文的发表时间）