A Design of Boundary Scan Test Controller for Digital Circuits

摘要：

A design of boundary scan test controller for digital circuits is presented in the paper. The design absolutely fulfills the requirements of the boundary scan standard IEEE1149.1, and is chiefly composed of an AVR and a test bus controller chip named SN74ACT8990. Based on the boundary scan test theories, the controller makes the fault diagnosis of digital circuits more efficient and less expensive. The functions are verified by a test experiment.

关键词： boundary scan test controller digital circuits fault diagnose

作者: XU Lei CHEN Shengjian WANG Yu Wang Jinyang

作者单位: Academy of Armored Forces Engineering, Beijing, China, 100072 North Vehicles Research Institute, Beijing,China,100071

会议类型: 国际会议

会议名称: 第八届国际测试技术研讨会(8th International Symposium on Test and Measurement)

会议地点: 重庆

会议语种:英文

页码: 356-360

在线出版日期: 2009-08-01（万方平台首次上网日期，不代表论文的发表时间）